Cohu enters silicon carbide burn-in test market

Cohu (COHU) announced that a leading European customer has selected Cohu’s Neon system for high-speed handling and inspection of high-power SiC dies in burn-in test applications. This expands Cohu’s products into burn-in and stress-test SiC processes. Cohu’s solution offers a proprietary carrier concept that allows singulated die burn-in and stress-test for up to 150 devices per carrier, enabling high parallel test, and optimizing yield and productivity. The unique interface solution enables high-power test up to 2,500V and heat dissipation capability up to 3,000W. In conjunction with test, Cohu’s vision inspection metrology technology provides 6-sided optical inspection with micro-scale defect detection and full traceability from wafer input to output, satisfying stringent automotive zero-defect requirements. The accompanying AI inspection software utilizes proprietary deep learning and neural network-based pattern recognition to improve inspection yield and maximize throughput, reducing customers’ total cost of ownership. The silicon carbide power market is projected to be approximately $2.2 billion this year with a CAGR of 25% through 2029 driven mainly by vehicle electrification and renewable energy, representing a $50 million market opportunity for Cohu in this type of equipment. “We are pleased to have received multiple orders from one of the world’s leading silicon carbide power device manufacturers for this application,” commented Luis Muller, Cohu President and CEO. “This new product configuration will extend our offering in the silicon carbide market, enabling burn-in test at the die-level to significantly lower our customers’ cost and optimizing yield and productivity.”